Title: Measurement of the enhanced evanescent fields of integrated waveguides for optical near-field sensing
Authors: Hahn, Julia
Rüter, Christian E. 
Fecher, Frank
Petter, Jürgen
Kip, Detlef  
Tschudi, Theo
Language: en
Subject (DDC): DDC::500 Naturwissenschaften und Mathematik
Issue Date: May-2008
Publisher: Soc.
Document Type: Article
Journal / Series / Working Paper (HSU): Applied optics 
Volume: 47
Issue: 13
Page Start: 2357
Page End: 2360
Publisher Place: Washington, DC
The sensitivity of an integrated optical sensing device can be enhanced by coating it with a high refractive index layer, while both incoupled intensity and spatial resolution are maintained. The potential for enhanced sensing is demonstrated using titanium indiffused waveguiding structures in LiNbO(3) coated with a TiO(2) film. To the best of our knowledge, it could be measured for the first time that the outcoupled intensity at the surface was enhanced by a factor of 12-15 while keeping the penetration depth of the evanescent field constant of the order of only a few tens of nanometers. The evanescent fields of the guided modes were measured and characterized with a scanning near-field optical microscope and are in accordance with the numerical simulations.
Organization Units (connected with the publication): Technische Universität Clausthal
ISSN: 1559-128X
DOI: 10.1364/ao.47.002357
Appears in Collections:Publications of the HSU Researchers (before HSU)

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