| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hahn, Julia | - |
| dc.contributor.author | Rüter, Christian E. | - |
| dc.contributor.author | Fecher, Frank | - |
| dc.contributor.author | Petter, Jürgen | - |
| dc.contributor.author | Kip, Detlef | - |
| dc.contributor.author | Tschudi, Theo | - |
| dc.date.accessioned | 2021-12-29T07:28:28Z | - |
| dc.date.available | 2021-12-29T07:28:28Z | - |
| dc.date.issued | 2008-05 | - |
| dc.identifier.issn | 1559-128X | - |
| dc.description.abstract | The sensitivity of an integrated optical sensing device can be enhanced by coating it with a high refractive index layer, while both incoupled intensity and spatial resolution are maintained. The potential for enhanced sensing is demonstrated using titanium indiffused waveguiding structures in LiNbO(3) coated with a TiO(2) film. To the best of our knowledge, it could be measured for the first time that the outcoupled intensity at the surface was enhanced by a factor of 12-15 while keeping the penetration depth of the evanescent field constant of the order of only a few tens of nanometers. The evanescent fields of the guided modes were measured and characterized with a scanning near-field optical microscope and are in accordance with the numerical simulations. | - |
| dc.description.sponsorship | Technische Universität Clausthal | - |
| dc.language.iso | eng | - |
| dc.publisher | Soc. | - |
| dc.relation.ispartof | Applied optics | - |
| dc.title | Measurement of the enhanced evanescent fields of integrated waveguides for optical near-field sensing | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1364/ao.47.002357 | - |
| dc.identifier.pmid | 18449300 | - |
| dcterms.bibliographicCitation.volume | 47 | - |
| dcterms.bibliographicCitation.issue | 13 | - |
| dcterms.bibliographicCitation.pagestart | 2357 | - |
| dcterms.bibliographicCitation.pageend | 2360 | - |
| dcterms.bibliographicCitation.originalpublisherplace | Washington, DC | - |
| local.submission.type | only-metadata | - |
| item.grantfulltext | none | - |
| item.openairetype | Article | - |
| item.languageiso639-1 | en | - |
| item.fulltext_s | No Fulltext | - |
| item.fulltext | No Fulltext | - |
| crisitem.author.dept | Experimentalphysik und Materialwissenschaften | - |
| crisitem.author.orcid | 0000-0001-7923-0113 | - |
| crisitem.author.parentorg | Fakultät für Elektrotechnik | - |
| Appears in Collections: | 6 - Publication references (without fulltext) of your publications before HSU | |
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