Title: | Measurement of the enhanced evanescent fields of integrated waveguides for optical near-field sensing | Authors: | Hahn, Julia Rüter, Christian E. Fecher, Frank Petter, Jürgen Kip, Detlef Tschudi, Theo |
Language: | eng | Issue Date: | May-2008 | Publisher: | Soc. | Document Type: | Article | Journal / Series / Working Paper (HSU): | Applied optics | Volume: | 47 | Issue: | 13 | Page Start: | 2357 | Page End: | 2360 | Publisher Place: | Washington, DC | Abstract: | The sensitivity of an integrated optical sensing device can be enhanced by coating it with a high refractive index layer, while both incoupled intensity and spatial resolution are maintained. The potential for enhanced sensing is demonstrated using titanium indiffused waveguiding structures in LiNbO(3) coated with a TiO(2) film. To the best of our knowledge, it could be measured for the first time that the outcoupled intensity at the surface was enhanced by a factor of 12-15 while keeping the penetration depth of the evanescent field constant of the order of only a few tens of nanometers. The evanescent fields of the guided modes were measured and characterized with a scanning near-field optical microscope and are in accordance with the numerical simulations. |
Organization Units (connected with the publication): | Technische Universität Clausthal | ISSN: | 1559-128X | Publisher DOI: | 10.1364/ao.47.002357 |
Appears in Collections: | 6 - Publication references (without fulltext) of your publications before HSU |
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