| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Cammin, Christoph | - |
| dc.contributor.author | Krush, Dmytro | - |
| dc.contributor.author | Heynicke, Ralf | - |
| dc.contributor.author | Scholl, Gerd | - |
| dc.date.accessioned | 2022-03-23T09:22:06Z | - |
| dc.date.available | 2022-03-23T09:22:06Z | - |
| dc.date.issued | 2018-03-23 | - |
| dc.identifier.issn | 21948771 | - |
| dc.description.abstract | A test method for narrowband wireless sensor/actuator networks is presented, facilitating affordable and efficient performance and compliance tests prior to the deployment of the wireless communication systems. Commonly used channel models are examined to derive a worst-case test scenario. Employing frequency/time division multiple access (F/TDMA) techniques and protocol synchronization, a new and efficient test method is suggested, where the equipment under test (EUT) is evaluated under the worst-case scenario. A cost-efficient channel emulator is introduced to emulate fading in multipath environments. Also, industrial interferes can be included in the setup. Furthermore, a procedure to test wireless devices with integrated, non-detachable antennas is presented. | de_DE |
| dc.description.sponsorship | Elektrische Messtechnik | de_DE |
| dc.language.iso | en | de_DE |
| dc.relation.ispartof | Journal of sensors and sensor systems | de_DE |
| dc.subject.ddc | DDC::600 Technik, Medizin, angewandte Wissenschaften::620 Ingenieurwissenschaften | de_DE |
| dc.title | Test method for narrowband F/TDMA-based wireless sensor/actuator networks including radio channel emulation in severe multipath environments | de_DE |
| dc.type | Article | de_DE |
| dc.identifier.doi | 10.5194/jsss-7-183-2018 | - |
| dc.identifier.scopus | 2-s2.0-85044406257 | - |
| dcterms.bibliographicCitation.pagestart | 183 | de_DE |
| dcterms.bibliographicCitation.pageend | 192 | de_DE |
| dc.identifier.url | https://api.elsevier.com/content/abstract/scopus_id/85044406257 | - |
| local.submission.type | only-metadata | de_DE |
| dc.identifier.eissn | 2194878X | - |
| dc.description.peerReviewed | Yes | de_DE |
| dc.type.article | Scientific Article | de_DE |
| item.grantfulltext | none | - |
| item.fulltext_s | No Fulltext | - |
| item.languageiso639-1 | en | - |
| item.fulltext | No Fulltext | - |
| item.openairetype | Article | - |
| crisitem.author.dept | Elektrische Messtechnik | - |
| crisitem.author.dept | Elektrische Messtechnik | - |
| crisitem.author.dept | Elektrische Messtechnik | - |
| crisitem.author.parentorg | Fakultät für Elektrotechnik | - |
| crisitem.author.parentorg | Fakultät für Elektrotechnik | - |
| crisitem.author.parentorg | Fakultät für Elektrotechnik | - |
| Appears in Collections: | Publications of the HSU Researchers | |
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