Title: Understanding the dependence of the ohmic drain-source leakage current on gold deposition rate in top-contact pentacene-based thin film transistors
Authors: Qin, Wenjie 
Göbel, Holger  
Language: en
Issue Date: 2016
Publisher: Elsevier
Document Type: Article
Source: Enthalten in: Microelectronic engineering. - [S.l.] : Elsevier, 1983- ; ZDB-ID: 1497065-X . - Bd. 162.2016, Seite 96-99
Journal / Series / Working Paper (HSU): Microelectronic engineering 
Volume: 162
Volume: 162
Page Start: 96
Page End: 99
Organization Units (connected with the publication): Elektronik 
URL: https://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=870490974
DOI: 10.1016/j.mee.2016.05.016
Appears in Collections:2016

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