| Title: | Understanding the dependence of the ohmic drain-source leakage current on gold deposition rate in top-contact pentacene-based thin film transistors | Authors: | Qin, Wenjie Göbel, Holger  |
Language: | en | Issue Date: | 2016 | Publisher: | Elsevier | Document Type: | Article | Source: | Enthalten in: Microelectronic engineering. - [S.l.] : Elsevier, 1983- ; ZDB-ID: 1497065-X . - Bd. 162.2016, Seite 96-99 | Journal / Series / Working Paper (HSU): | Microelectronic engineering | Volume: | 162 | Volume: | 162 | Page Start: | 96 | Page End: | 99 | Organization Units (connected with the publication): | Elektronik | URL: | https://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=870490974 | DOI: | 10.1016/j.mee.2016.05.016 |
| Appears in Collections: | 2016 |
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