Title: Semantic modeling for collaboration and cooperation of systems in the production domain
Authors: Hildebrandt, Constantin
Scholz, André
Fay, Alexander 
Schröder, Tizian
Hadlich, Thomas
Diedrich, Christian
Dubovy, Martin
Eck, Christian
Wiegand, Ralf
Language: eng
Issue Date: 2018
Publisher: IEEE
Document Type: Conference Object
Source: Enthalten in: 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation / IEEE International Conference on Emerging Technologies and Factory Automation 22.. - [Piscataway, NJ] : IEEE, c2017. - 2018, insges. 8 S.
Published in (Book): 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Limassol, Cyprus, 12.-15. Sept. 2017
Publisher Place: Piscataway, NJ
Conference: 22nd International Conference on Emerging Technologies and Factory Automation (ETFA) 2017
Abstract: 
Cooperation and collaboration of technical systems in different application contexts is one of the main targets of the vision of “Industrie 4.0” (I40). In order to bring this vision to industrial practice, it is necessary to define a semantic basis for information exchange between systems. This paper provides the results of a project that focused on semantic modeling based on standards relevant in the I40 context. Particularly, a meta model for modeling mechatronic systems as well as a meta model for modeling the systems characteristics is provided. The combination of the two developed meta models can be used for implementation in semantic technologies, i.e. Web Ontology Language, or AutomationML. Furthermore, a use-case is introduced that shows an implementation of the meta models in AutomationML with the use of ecl@ss properties in the engineering and operation of a discrete manufacturing system.
Description: 
2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation / IEEE International Conference on Emerging Technologies and Factory Automation 22.
Organization Units (connected with the publication): Automatisierungstechnik 
Publisher DOI: 10.1109/ETFA.2017.8247585
Appears in Collections:3 - Publication references (without fulltext)

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