DC FieldValueLanguage
dc.contributor.authorBarbary, Inès-
dc.contributor.authorHagel, Michael-
dc.contributor.authorStiemer, Marcus-
dc.contributor.authorPape, Rainer-
dc.contributor.authorKleine-Ostmann, Thomas-
dc.contributor.authorSchrader, Thomas-
dc.date.accessioned2020-03-30T09:07:09Z-
dc.date.available2020-03-30T09:07:09Z-
dc.date.issued2017-
dc.identifier.citationEnthalten in: 2017 International Symposium on Electromagnetic Compatibility - EMC Europe. - Piscataway, NJ : IEEE, 2017. - 1 Online-ressource. - 2017, insges. 6 S-
dc.identifier.isbn978-1-5386-0689-6-
dc.description.sponsorshipTheoretische Elektrotechnik-
dc.language.isoeng-
dc.publisherIEEE-
dc.titleDependence of an OATS Site Insertion Loss on the Admitted Parameter Tolerances-
dc.typeConference Object-
dc.relation.conferenceInternational Symposium on Electromagnetic Compatibility (EMC Europe) 2017-
dc.identifier.doi10.1109/EMCEurope.2017.8094738-
dcterms.bibliographicCitation.originalpublisherplacePiscataway, NJ-
local.submission.typeonly-metadata-
dc.type.conferenceObjectConference Paper-
hsu.opac.importopac-2017-
hsu.identifier.ppn898472547-
hsu.peerReviewed-
item.grantfulltextnone-
item.languageiso639-1en-
item.fulltext_sNo Fulltext-
item.openairetypeConference Object-
item.fulltextNo Fulltext-
crisitem.author.deptTheoretische Elektrotechnik-
crisitem.author.deptTheoretische Elektrotechnik-
crisitem.author.parentorgFakultät für Elektrotechnik-
crisitem.author.parentorgFakultät für Elektrotechnik-
Appears in Collections:3 - Publication references (without fulltext)
Show simple item record

CORE Recommender

Google ScholarTM

Check

Altmetric

Altmetric


Items in openHSU are protected by copyright, with all rights reserved, unless otherwise indicated.