DC FieldValueLanguage
dc.contributor.authorMeissner, Michael-
dc.contributor.authorFahlbusch, Sebastian-
dc.contributor.authorHoffmann, Klaus F.-
dc.date.accessioned2020-03-24T08:25:10Z-
dc.date.available2020-03-24T08:25:10Z-
dc.date.issued2017-
dc.identifier.citationEnthalten in: PCIM Europe 2017 / PCIM Europe Veranstaltung 2017 Nürnberg. - Berlin : VDE Verlag GmbH, 2017 . - 2017, insges. 6 S.de_DE
dc.description.sponsorshipLeistungselektronikde_DE
dc.language.isoende_DE
dc.publisherVDE Verlagde_DE
dc.titleAutomated Test Bench for the Measurement of Si-IGBT and SiC-MOSFET Hybrid Switchesde_DE
dc.typeArticlede_DE
dc.relation.conferencePCIM Europe 2017; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Managementde_DE
dcterms.bibliographicCitation.originalpublisherplaceBerlinde_DE
dc.relation.pages6 S.de_DE
dc.identifier.urlhttps://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=1048298620-
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7990664-
local.submission.typeonly-metadatade_DE
dcterms.bibliographicCitation.isPartOfPCIM Europe 2017 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management : 16-18 May 2017 Nürnbergde_DE
item.grantfulltextnone-
item.fulltext_sNo Fulltext-
item.languageiso639-1en-
item.fulltextNo Fulltext-
item.openairetypeArticle-
crisitem.author.deptLeistungselektronik-
crisitem.author.deptLeistungselektronik-
crisitem.author.deptDekanat Elektrotechnik-
crisitem.author.deptFakultät für Elektrotechnik-
crisitem.author.parentorgFakultät für Elektrotechnik-
crisitem.author.parentorgFakultät für Elektrotechnik-
crisitem.author.parentorgFakultät für Elektrotechnik-
crisitem.author.parentorgFakultäten-
Appears in Collections:2017
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