Title: Automated Test Bench for the Measurement of Si-IGBT and SiC-MOSFET Hybrid Switches
Authors: Meissner, Michael 
Fahlbusch, Sebastian 
Hoffmann, Klaus F. 
Language: en
Issue Date: 2017
Publisher: VDE Verlag
Document Type: Article
Source: Enthalten in: PCIM Europe 2017 / PCIM Europe Veranstaltung 2017 Nürnberg. - Berlin : VDE Verlag GmbH, 2017 . - 2017, insges. 6 S.
Pages: 6 S.
Publisher Place: Berlin
Conference: PCIM Europe 2017; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management 
Organization Units (connected with the publication): Leistungselektronik 
URL: https://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=1048298620
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7990664
Appears in Collections:2017

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