| Title: | Automated Test Bench for the Measurement of Si-IGBT and SiC-MOSFET Hybrid Switches | Authors: | Meissner, Michael Fahlbusch, Sebastian Hoffmann, Klaus F. |
Language: | en | Issue Date: | 2017 | Publisher: | VDE Verlag | Document Type: | Article | Source: | Enthalten in: PCIM Europe 2017 / PCIM Europe Veranstaltung 2017 Nürnberg. - Berlin : VDE Verlag GmbH, 2017 . - 2017, insges. 6 S. | Pages: | 6 S. | Publisher Place: | Berlin | Conference: | PCIM Europe 2017; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management | Organization Units (connected with the publication): | Leistungselektronik | URL: | https://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=1048298620 http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7990664 |
| Appears in Collections: | 2017 |
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