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  5. Automated Test Bench for the Measurement of Si-IGBT and SiC-MOSFET Hybrid Switches
 
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Automated Test Bench for the Measurement of Si-IGBT and SiC-MOSFET Hybrid Switches

Publication date
2017
Document type
Research article
Author
Meissner, Michael 
Fahlbusch, Sebastian
Hoffmann, Klaus F. 
Organisational unit
Leistungselektronik 
URL
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7990664
URI
https://openhsu.ub.hsu-hh.de/handle/10.24405/5516
Conference
PCIM Europe 2017 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
Publisher
VDE Verlag
Part of the university bibliography
✅
  • Additional Information
Language
English
Description
PCIM Europe 2017 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management : 16-18 May 2017 Nürnberg
Cite as
Enthalten in: PCIM Europe 2017 / PCIM Europe Veranstaltung 2017 Nürnberg. - Berlin : VDE Verlag GmbH, 2017 . - 2017, insges. 6 S.
Version
Not applicable (or unknown)
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