| Title: | Impact of gold deposition parameters on the drain-source leakage current in top-contact pentacene-based thin-film transistors | Authors: | Göbel, Holger  Qin, Wenjie |
Language: | en | Issue Date: | 2017 | Publisher: | Elsevier | Document Type: | Article | Source: | Enthalten in: Microelectronic engineering. - [S.l.] : Elsevier, 1983. - Online-Ressource . - Bd. 170.2017, Seite 29-33 | Journal / Series / Working Paper (HSU): | Microelectronic engineering | Volume: | 170 | Organization Units (connected with the publication): | Elektronik | URL: | https://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=886427649 | DOI: | 10.1016/j.mee.2016.12.019 |
| Appears in Collections: | 2017 |
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