Title: Impact of gold deposition parameters on the drain-source leakage current in top-contact pentacene-based thin-film transistors
Authors: Göbel, Holger  
Qin, Wenjie 
Language: en
Issue Date: 2017
Publisher: Elsevier
Document Type: Article
Source: Enthalten in: Microelectronic engineering. - [S.l.] : Elsevier, 1983. - Online-Ressource . - Bd. 170.2017, Seite 29-33
Journal / Series / Working Paper (HSU): Microelectronic engineering 
Volume: 170
Organization Units (connected with the publication): Elektronik 
URL: https://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=886427649
DOI: 10.1016/j.mee.2016.12.019
Appears in Collections:2017

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