Title: Reliability Investigation on SiC based Diode and MOSFET Modules Developed for High Power Conversion in Medical X-Ray Applications
Authors: Otto, Alexander
Dudek, Rainer
Rzepka, Sven
Abo Ras, Mohamad
von Essen, Tobias
Bast, Markus
Hindel, Armin
Eisele, Ronald
Müter, Ulf
Lunding, Arne
Language: en
Issue Date: 2017
Document Type: Book Part
Source: Enthalten in: PCIM Europe 2017 / PCIM Europe Veranstaltung 2017 Nürnberg. - Berlin : VDE Verlag GmbH, 2017 . - 2017, insges. 8 S
Publisher: VDE Verlag GmbH
Publisher Place: Berlin
Conference: PCIM Europe 2017; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management 
URL: https://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=104829983X
Appears in Collections:2017

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