DC FieldValueLanguage
dc.contributor.authorCammin, Christoph-
dc.contributor.authorKrush, Dmytro-
dc.contributor.authorHeynicke, Ralf-
dc.contributor.authorScholl, Gerd-
dc.date.accessioned2022-07-25T08:41:03Z-
dc.date.available2022-07-25T08:41:03Z-
dc.date.issued2021-08-
dc.identifier.isbn9781665413862-
dc.description.abstractReverberation chambers (RCs) can be used as repeatable and shielded test environments for electromagnetic compatibility testing and performance evaluation of wireless com-munication devices, as they inherently emulate a Rician/Rayleigh fading environment. Loading a RC with radio frequency (RF) absorbing material leads to an increasing coherence bandwidth (CBW) of the radio channel within the RC, where the appropriate value can be tailored to specific test specifications. In this paper the CBW is directly measured by the wireless system under test. Measurements were carried out with different loadings and the link quality indication (LQI) was used to determine an appropriate RC loading.-
dc.description.sponsorshipElektrische Messtechnik-
dc.language.isoeng-
dc.publisherIEEE-
dc.relationIO-Link Wireless for IEC-Approval-
dc.subjectIO-Link Wireless-
dc.subjectLoading-
dc.subjectNB-IoT-
dc.subjectOver-the-Air (OTA) Test-
dc.subjectReverberation Chamber-
dc.titleSensing Reverberation Chamber Loading for IO-Link Wireless Testing-
dc.typeConference Object-
dc.relation.conferenceInternational Conference on Electromagnetics in Advanced Applications, ICEAA 2021-
dc.identifier.doi10.1109/ICEAA52647.2021.9539761-
dc.identifier.scopus2-s2.0-85116206169-
local.submission.typeonly-metadata-
dc.type.conferenceObjectConference Paper-
item.grantfulltextnone-
item.openairetypeConference Object-
item.languageiso639-1en-
item.fulltext_sNo Fulltext-
item.fulltextNo Fulltext-
crisitem.author.deptElektrische Messtechnik-
crisitem.author.deptElektrische Messtechnik-
crisitem.author.deptElektrische Messtechnik-
crisitem.author.parentorgFakultät für Elektrotechnik-
crisitem.author.parentorgFakultät für Elektrotechnik-
crisitem.author.parentorgFakultät für Elektrotechnik-
Appears in Collections:3 - Publication references (without fulltext)
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