| Title: | Chemical and photoelectrochemical instability of amorphous TiO2 layers quantified by spectroscopic ellipsometry | Authors: | Kriegel, Herman Kollmann, J. Raudsepp, Ragle Klassen, Thomas Schieda, Mauricio |
Language: | eng | Issue Date: | 2020 | Document Type: | Article | Source: | Enthalten in: Journal of materials chemistry. - London [u.a.] : RSC, 2013. - Online-Ressource . - Bd. 8.2020, 35, Seite 18173-18179 | Journal / Series / Working Paper (HSU): | Journal of materials chemistry A | Volume: | 8 | Issue: | 35 | Page Start: | 18173 | Page End: | 18179 | Description: | London |
Organization Units (connected with the publication): | Werkstoffkunde | Publisher DOI: | 10.1039/D0TA04878J |
| Appears in Collections: | 3 - Publication references (without fulltext) |
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