DC FieldValueLanguage
dc.contributor.authorHofer, Alexander-
dc.contributor.authorBiberger, Roland-
dc.contributor.authorBenstetter, Günther-
dc.contributor.authorWilke, Björn-
dc.contributor.authorGöbel, Holger-
dc.date.accessioned2021-03-16T14:27:31Z-
dc.date.available2021-03-16T14:27:31Z-
dc.date.issued2013-
dc.identifier.citationEnthalten in: Microelectronics reliability. - Amsterdam [u.a.] : Elsevier, 1964 . - Bd. 53.2013, 9, Seite 1430-1433 Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films863823130de_DE
dc.description.sponsorshipElektronikde_DE
dc.language.isoende_DE
dc.publisherElsevierde_DE
dc.relation.ispartofMicroelectronics reliabilityde_DE
dc.subjectUniversitätsbibliographiede_DE
dc.subjectEvaluation 2013de_DE
dc.titleScanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor filmsde_DE
dc.typeArticlede_DE
hsu.accessrights.dnbblockedde_DE
dcterms.bibliographicCitation.volume53de_DE
dcterms.bibliographicCitation.issue9de_DE
dcterms.bibliographicCitation.pagestart1430de_DE
dcterms.bibliographicCitation.pageend1433de_DE
dcterms.bibliographicCitation.originalpublisherplaceAmsterdam [u.a.]de_DE
dc.identifier.urlhttps://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=863823130-
local.submission.typeonly-metadatade_DE
item.grantfulltextnone-
item.fulltext_sNo Fulltext-
item.languageiso639-1en-
item.fulltextNo Fulltext-
item.openairetypeArticle-
crisitem.author.deptElektronik-
crisitem.author.orcid0000-0003-2397-8688-
crisitem.author.parentorgFakultät für Elektrotechnik-
Appears in Collections:2013
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