Title: Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films
Authors: Hofer, Alexander
Biberger, Roland
Benstetter, Günther
Wilke, Björn
Göbel, Holger  
Language: en
Keywords: Universitätsbibliographie;Evaluation 2013
Issue Date: 2013
Publisher: Elsevier
Document Type: Article
Source: Enthalten in: Microelectronics reliability. - Amsterdam [u.a.] : Elsevier, 1964 . - Bd. 53.2013, 9, Seite 1430-1433 Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films863823130
Journal / Series / Working Paper (HSU): Microelectronics reliability 
Volume: 53
Issue: 9
Page Start: 1430
Page End: 1433
Publisher Place: Amsterdam [u.a.]
Organization Units (connected with the publication): Elektronik 
URL: https://ub.hsu-hh.de/DB=1.8/XMLPRS=N/PPN?PPN=863823130
Appears in Collections:2013

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