DC FieldValueLanguage
dc.contributor.authorFichte, Lars Ole-
dc.contributor.authorKnoth, Sven-
dc.contributor.authorPotthast, Stefan-
dc.contributor.authorSabath, Frank-
dc.contributor.authorStiemer, Marcus-
dc.date.accessioned2021-01-11T09:47:41Z-
dc.date.available2021-01-11T09:47:41Z-
dc.date.issued2015-
dc.identifier.citationIn: IEEE International Symposium on Electromagnetic Compatibility (EMC), 2015 / Institute of Electrical and Electronics Engineers. - Piscataway, NJ : IEEE, 2015. - 2015, Seite 865-870-
dc.identifier.isbn978-1-4799-6617-2-
dc.description.sponsorshipTheoretische Elektrotechnik-
dc.language.isoeng-
dc.publisherIEEE-
dc.titleOn the Validity and Statistical Significance of HEMP Test Standards-
dc.typeConference Object-
dc.relation.conferenceInternational Symposium on Electromagnetic Compatibility (EMC Europe) 2015-
dc.identifier.doi10.1109/ISEMC.2015.7256278-
dcterms.bibliographicCitation.pagestart865-
dcterms.bibliographicCitation.pageend870-
dcterms.bibliographicCitation.originalpublisherplacePiscataway, NJ-
local.submission.typeonly-metadata-
dc.type.conferenceObjectConference Paper-
hsu.opac.importopac-2015-
hsu.identifier.ppn845402013-
hsu.peerReviewed-
item.grantfulltextnone-
item.languageiso639-1en-
item.fulltext_sNo Fulltext-
item.openairetypeConference Object-
item.fulltextNo Fulltext-
crisitem.author.deptTheoretische Elektrotechnik-
crisitem.author.deptRechnergestützte Statistik-
crisitem.author.deptTheoretische Elektrotechnik-
crisitem.author.orcid0000-0002-9666-5554-
crisitem.author.parentorgFakultät für Elektrotechnik-
crisitem.author.parentorgFakultät für Wirtschafts- und Sozialwissenschaften-
crisitem.author.parentorgFakultät für Elektrotechnik-
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