DC FieldValueLanguage
dc.contributor.authorFichte, Lars Ole-
dc.contributor.authorKnoth, Sven-
dc.contributor.authorPotthast, Stefan-
dc.contributor.authorSabath, Frank-
dc.contributor.authorStiemer, Marcus-
dc.date.accessioned2021-01-11T09:47:41Z-
dc.date.available2021-01-11T09:47:41Z-
dc.date.issued2015-
dc.identifier.citationIn: IEEE International Symposium on Electromagnetic Compatibility (EMC), 2015 / Institute of Electrical and Electronics Engineers. - Piscataway, NJ : IEEE, 2015 . - 2015, Seite 865-870de_DE
dc.identifier.isbn978-1-4799-6617-2-
dc.descriptionIEEE International Symposium on Electromagnetic Compatibility (EMC), 2015 : [joint conference with] EMC Europe ; 16 - 22 Aug. 2015, Dresdende_DE
dc.description.sponsorshipTheoretische Elektrotechnikde_DE
dc.language.isoengde_DE
dc.publisherIEEEde_DE
dc.titleOn the Validity and Statistical Significance of HEMP Test Standardsde_DE
dc.typeConference Objectde_DE
dc.relation.conferenceInternational Symposium on Electromagnetic Compatibility (EMC Europe) 2015de_DE
dc.identifier.doi10.1109/ISEMC.2015.7256278-
dcterms.bibliographicCitation.pagestart865de_DE
dcterms.bibliographicCitation.pageend870de_DE
dcterms.bibliographicCitation.originalpublisherplacePiscataway, NJde_DE
local.submission.typeonly-metadatade_DE
dc.description.peerReviewed-
hsu.opac.importopac-2015-
hsu.identifier.ppn845402013-
item.grantfulltextnone-
item.languageiso639-1en-
item.fulltextNo Fulltext-
item.fulltext_sNo Fulltext-
item.openairetypeConference Object-
crisitem.author.deptTheoretische Elektrotechnik-
crisitem.author.deptRechnergestützte Statistik-
crisitem.author.deptTheoretische Elektrotechnik-
crisitem.author.orcid0000-0002-9666-5554-
crisitem.author.parentorgFakultät für Elektrotechnik-
crisitem.author.parentorgFakultät für Wirtschafts- und Sozialwissenschaften-
crisitem.author.parentorgFakultät für Elektrotechnik-
Appears in Collections:3 - Reported Publications
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