Publication:
On the Validity and Statistical Significance of HEMP Test Standards

cris.virtual.departmentTheoretische Elektrotechnik
cris.virtual.departmentRechnergestützte Statistik
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cris.virtual.departmentTheoretische Elektrotechnik
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cris.virtual.departmentbrowseTheoretische Elektrotechnik
cris.virtual.departmentbrowseRechnergestützte Statistik
cris.virtual.departmentbrowseTheoretische Elektrotechnik
cris.virtual.departmentbrowseTheoretische Elektrotechnik
cris.virtual.departmentbrowseRechnergestützte Statistik
cris.virtual.departmentbrowseTheoretische Elektrotechnik
cris.virtualsource.department3985e543-0138-437e-a2dd-26c6bad10a4d
cris.virtualsource.department4dc9793a-d8a2-40ea-9d5d-02347a1220f5
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cris.virtualsource.departmentae5f4072-5ba0-47e5-8307-03451a3c4b5c
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dc.contributor.authorFichte, Lars Ole
dc.contributor.authorKnoth, Sven
dc.contributor.authorPotthast, Stefan
dc.contributor.authorSabath, Frank
dc.contributor.authorStiemer, Marcus
dc.date.issued2015
dc.description.versionNA
dc.identifier.citationIn: IEEE International Symposium on Electromagnetic Compatibility (EMC), 2015 / Institute of Electrical and Electronics Engineers. - Piscataway, NJ : IEEE, 2015. - 2015, Seite 865-870
dc.identifier.doi10.1109/ISEMC.2015.7256278
dc.identifier.isbn978-1-4799-6617-2
dc.identifier.urihttps://openhsu.ub.hsu-hh.de/handle/10.24405/11012
dc.language.isoen
dc.publisherIEEE
dc.relation.conferenceInternational Symposium on Electromagnetic Compatibility (EMC Europe) 2015
dc.relation.orgunitTheoretische Elektrotechnik
dc.rights.accessRightsmetadata only access
dc.titleOn the Validity and Statistical Significance of HEMP Test Standards
dc.typeConference paper
dcterms.bibliographicCitation.originalpublisherplacePiscataway, NJ
dspace.entity.typePublication
hsu.identifier.ppn845402013
hsu.peerReviewed
hsu.uniBibliography
oaire.citation.endPage870
oaire.citation.startPage865
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