Publication:
Chemical and photoelectrochemical instability of amorphous TiO2 layers quantified by spectroscopic ellipsometry

cris.customurl 12208
cris.virtual.department #PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department Werkstoffkunde
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cris.virtual.departmentbrowse Werkstoffkunde
cris.virtual.departmentbrowse Werkstoffkunde
cris.virtual.departmentbrowse Werkstoffkunde
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cris.virtualsource.department #PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtualsource.department f10dc8f7-5140-4c45-8dec-4d30ca028765
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dc.contributor.author Kriegel, Herman
dc.contributor.author Kollmann, J.
dc.contributor.author Raudsepp, Ragle
dc.contributor.author Klassen, Thomas
dc.contributor.author Schieda, Mauricio
dc.date.issued 2020
dc.description London
dc.description.version NA
dc.identifier.citation Enthalten in: Journal of materials chemistry. - London [u.a.] : RSC, 2013. - Online-Ressource . - Bd. 8.2020, 35, Seite 18173-18179
dc.identifier.doi 10.1039/D0TA04878J
dc.identifier.uri https://openhsu.ub.hsu-hh.de/handle/10.24405/12208
dc.language.iso en
dc.relation.journal Journal of materials chemistry A
dc.relation.orgunit Werkstoffkunde
dc.rights.accessRights metadata only access
dc.title Chemical and photoelectrochemical instability of amorphous TiO2 layers quantified by spectroscopic ellipsometry
dc.type Research article
dspace.entity.type Publication
hsu.peerReviewed
hsu.uniBibliography
oaire.citation.endPage 18179
oaire.citation.issue 35
oaire.citation.startPage 18173
oaire.citation.volume 8
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