Publication:
Method for process modelling and analysis with regard to the requirements of Industry 4.0

cris.customurl4168
cris.virtual.departmentAutomatisierungstechnik
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cris.virtual.departmentbrowseAutomatisierungstechnik
cris.virtual.departmentbrowseAutomatisierungstechnik
cris.virtual.departmentbrowseAutomatisierungstechnik
cris.virtualsource.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtualsource.departmentd27eae86-6d38-489c-b4c3-2eed27fb81cc
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dc.contributor.authorLewin, Markus
dc.contributor.authorVoigtländer, Sebastian
dc.contributor.authorFay, Alexander
dc.date.issued2017
dc.description.abstractDigitalization and Industry 4.0 create new opportunities and challenges in production and logistics. This also applies to methods for process modelling and analysis. The following paper discusses the possibilities, chances and limitations of the value stream method in this context. For this purpose, requirements regarding process modelling and analysis in digitalization and Industry 4.0 have been systematized by a criteria catalogue. Different extensions of the value stream method are described, discussed and evaluated in order to depict deficits in the current methods. Furthermore, an approach for the visualization of Industry 4.0 systems at the conceptual stage of Industry 4.0 projects has been developed, based on the value stream method. A case study evaluation shows possibilities of this approach.
dc.description.versionNA
dc.identifier.doi10.1109/IECON.2017.8216677
dc.identifier.urihttps://openhsu.ub.hsu-hh.de/handle/10.24405/4168
dc.language.isoen
dc.relation.conference43rd Annual Conference of the IEEE Industrial Electronics Society : IECON 2017
dc.relation.orgunitAutomatisierungstechnik
dc.rights.accessRightsmetadata only access
dc.titleMethod for process modelling and analysis with regard to the requirements of Industry 4.0
dc.title.alternativeAn extension of the value stream method
dc.typeConference paper
dcterms.bibliographicCitation.booktitleIECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, 29 Oct.-1 Nov. 2017
dspace.entity.typePublication
hsu.uniBibliography
oaire.citation.endPage3962
oaire.citation.startPage3957
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