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  5. Evaluation of novel high-bandwidth current sensors for high-current SiC-applications

Evaluation of novel high-bandwidth current sensors for high-current SiC-applications

Publication date
2025-06-30
Document type
Konferenzbeitrag
Author
Haag, Felix  
Albrecht, Fabian  
Brommer, Volker
Liebfried, Oliver
Hoffmann, Klaus  
Organisational unit
Leistungselektronik  
DOI
10.30420/566541346
URI
https://openhsu.ub.hsu-hh.de/handle/10.24405/21031
Scopus ID
2-s2.0-105013844497
Conference
PCIM Conference 2025 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management ; Nuremberg, Germany ; May 6-8, 2025
Publisher
VDE Verlag
Book title
PCIM 2025: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
ISBN
978-3-8007-6541-6
First page
2595
Last page
2603
Peer-reviewed
✅
Part of the university bibliography
✅
Additional Information
Language
English
Abstract
High bandwidth current sensors are needed to capture the fast switching transients of modern wide-bandgap semiconductor switches made from GaN and SiC. This work evaluates the usage of novel current sensors such as the M-Shunt and the second-generation Infinity Sensor for their ability to accurately resolve switching transients in the range of nanoseconds in high-current applications. Important metrics include: high bandwidth, low insertion inductance, small size and DC-capability. Measurement results are compared to established current sensors (Rogowski coil and coaxial shunt). Double pulse tests in an NPC inverter application were performed to test the sensors up to currents of 400 A.
Version
Published version
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