Measurement of the enhanced evanescent fields of integrated waveguides for optical near-field sensing
Publication date
2008-05
Document type
Research article
Author
Organisational unit
Technische Universität Clausthal
Pubmed ID
Publisher
Soc.
Series or journal
Applied optics
ISSN
Periodical volume
47
Periodical issue
13
First page
2357
Last page
2360
Part of the university bibliography
Nein
Language
English
Abstract
The sensitivity of an integrated optical sensing device can be enhanced by coating it with a high refractive index layer, while both incoupled intensity and spatial resolution are maintained. The potential for enhanced sensing is demonstrated using titanium indiffused waveguiding structures in LiNbO(3) coated with a TiO(2) film. To the best of our knowledge, it could be measured for the first time that the outcoupled intensity at the surface was enhanced by a factor of 12-15 while keeping the penetration depth of the evanescent field constant of the order of only a few tens of nanometers. The evanescent fields of the guided modes were measured and characterized with a scanning near-field optical microscope and are in accordance with the numerical simulations.
Version
Not applicable (or unknown)
Access right on openHSU
Metadata only access