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Extracting knowledge using machine learning for anomaly detection and root-cause diagnosis

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cris.customurl 20488
cris.virtual.department Informatik im Maschinenbau
cris.virtual.department Informatik im Maschinenbau
cris.virtual.department Informatik im Maschinenbau
cris.virtual.department Informatik im Maschinenbau
cris.virtual.department #PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtual.departmentbrowse Informatik im Maschinenbau
cris.virtualsource.department 5fa68b15-d2ec-4da8-8f1a-cac6ea0a773f
cris.virtualsource.department d3e00cb1-d1ab-4c8f-882e-c033ff27bdd1
cris.virtualsource.department 5a48592a-0501-4524-a72f-cd50a6a1edcc
cris.virtualsource.department f318ef77-db4b-4956-9a01-97eee1ab0454
cris.virtualsource.department #PLACEHOLDER_PARENT_METADATA_VALUE#
dc.contributor.author Moddemann, Lukas
dc.contributor.author Steude, Henrik Sebastian
dc.contributor.author Diedrich, Alexander
dc.contributor.author Pill, Ingo
dc.contributor.author Niggemann, Oliver
dc.date.issued 2024-10-16
dc.description.version VoR
dc.identifier.isbn 979-8-3503-6123-0
dc.identifier.uri https://openhsu.ub.hsu-hh.de/handle/10.24405/20488
dc.language.iso en
dc.publisher IEEE
dc.relation.conference 29th International Conference on Emerging Technologies and Factory Automation (ETFA 2024) ; Padova, Italy ; September 10–13, 204
dc.relation.orgunit Informatik im Maschinenbau
dc.relation.orgunit DTEC.bw
dc.relation.project Künstliche Intelligenz für die Diagnose der Internationalen Raumstation ISS
dc.rights.accessRights metadata only access
dc.subject dtec.bw
dc.title Extracting knowledge using machine learning for anomaly detection and root-cause diagnosis
dc.type Konferenzbeitrag
dcterms.bibliographicCitation.booktitle 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA)
dcterms.bibliographicCitation.originalpublisherplace Piscataway, NJ
dspace.entity.type Publication
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