Publication: Deep Fading in a Reverberation Chamber for Wireless Device Testing
cris.customurl | 16496 | |
cris.virtual.department | Elektrische Messtechnik | |
cris.virtual.department | Elektrische Messtechnik | |
cris.virtual.department | Elektrische Messtechnik | |
cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
cris.virtual.departmentbrowse | Elektrische Messtechnik | |
cris.virtual.departmentbrowse | Elektrische Messtechnik | |
cris.virtual.departmentbrowse | Elektrische Messtechnik | |
cris.virtual.departmentbrowse | Elektrische Messtechnik | |
cris.virtual.departmentbrowse | Elektrische Messtechnik | |
cris.virtual.departmentbrowse | Elektrische Messtechnik | |
cris.virtual.departmentbrowse | Elektrische Messtechnik | |
cris.virtual.departmentbrowse | Elektrische Messtechnik | |
cris.virtual.departmentbrowse | Elektrische Messtechnik | |
cris.virtualsource.department | 0784a80b-3543-48d5-bd67-6aa21fcccfe1 | |
cris.virtualsource.department | 3b9dabae-d111-40b9-ba67-3068d31ce68f | |
cris.virtualsource.department | 321a596d-ac34-4e64-a57a-0fe9bed251fd | |
cris.virtualsource.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
dc.contributor.author | Cammin, Christoph | |
dc.contributor.author | Krush, Dmytro | |
dc.contributor.author | Heynicke, Ralf | |
dc.contributor.author | Scholl, Gerd | |
dc.date.issued | 2020-03 | |
dc.description.abstract | Reverberation chambers (RCs) are a feasible option as test environment for evaluation of wireless devices with integrated antenna as they inherently emulate a Rayleigh fading channel. In this paper the dependency of deep fading on the frequency and position/orientation of an equipment under test (EUT) antenna is evaluated for different numbers of RC steps and loading conditions. The measured data were applied to an exemplary standard for wireless communication. The measurement results are highly repeatable and independent of frequency or position/orientation of the EUT and loading conditions. | |
dc.description.version | VoR | |
dc.identifier.doi | 10.1088/1757-899x/766/1/012004 | |
dc.identifier.issn | 1757-899X | |
dc.identifier.uri | https://openhsu.ub.hsu-hh.de/handle/10.24405/16496 | |
dc.language.iso | en | |
dc.relation.conference | IEEE Radio and Antenna Days of the Indian Ocean 2019 23–26 September 2019, Saint-Gilles, Réunion | |
dc.relation.journal | IOP Conference Series: Materials Science and Engineering | |
dc.relation.orgunit | Elektrische Messtechnik | |
dc.rights.accessRights | metadata only access | |
dc.title | Deep Fading in a Reverberation Chamber for Wireless Device Testing | |
dc.type | Konferenzbeitrag | |
dspace.entity.type | Publication | |
hsu.peerReviewed | ✅ | |
hsu.uniBibliography | ✅ | |
oaire.citation.volume | 766 |