Publication:
Deep Fading in a Reverberation Chamber for Wireless Device Testing

cris.customurl16496
cris.virtual.departmentElektrische Messtechnik
cris.virtual.departmentElektrische Messtechnik
cris.virtual.departmentElektrische Messtechnik
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.departmentbrowseElektrische Messtechnik
cris.virtual.departmentbrowseElektrische Messtechnik
cris.virtual.departmentbrowseElektrische Messtechnik
cris.virtual.departmentbrowseElektrische Messtechnik
cris.virtual.departmentbrowseElektrische Messtechnik
cris.virtual.departmentbrowseElektrische Messtechnik
cris.virtual.departmentbrowseElektrische Messtechnik
cris.virtual.departmentbrowseElektrische Messtechnik
cris.virtual.departmentbrowseElektrische Messtechnik
cris.virtualsource.department0784a80b-3543-48d5-bd67-6aa21fcccfe1
cris.virtualsource.department3b9dabae-d111-40b9-ba67-3068d31ce68f
cris.virtualsource.department321a596d-ac34-4e64-a57a-0fe9bed251fd
cris.virtualsource.department#PLACEHOLDER_PARENT_METADATA_VALUE#
dc.contributor.authorCammin, Christoph
dc.contributor.authorKrush, Dmytro
dc.contributor.authorHeynicke, Ralf
dc.contributor.authorScholl, Gerd
dc.date.issued2020-03
dc.description.abstractReverberation chambers (RCs) are a feasible option as test environment for evaluation of wireless devices with integrated antenna as they inherently emulate a Rayleigh fading channel. In this paper the dependency of deep fading on the frequency and position/orientation of an equipment under test (EUT) antenna is evaluated for different numbers of RC steps and loading conditions. The measured data were applied to an exemplary standard for wireless communication. The measurement results are highly repeatable and independent of frequency or position/orientation of the EUT and loading conditions.
dc.description.versionVoR
dc.identifier.doi10.1088/1757-899x/766/1/012004
dc.identifier.issn1757-899X
dc.identifier.urihttps://openhsu.ub.hsu-hh.de/handle/10.24405/16496
dc.language.isoen
dc.relation.conferenceIEEE Radio and Antenna Days of the Indian Ocean 2019 23–26 September 2019, Saint-Gilles, Réunion
dc.relation.journalIOP Conference Series: Materials Science and Engineering
dc.relation.orgunitElektrische Messtechnik
dc.rights.accessRightsmetadata only access
dc.titleDeep Fading in a Reverberation Chamber for Wireless Device Testing
dc.typeKonferenzbeitrag
dspace.entity.typePublication
hsu.peerReviewed
hsu.uniBibliography
oaire.citation.volume766
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