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  5. Analysis of sensor disturbances caused by IEMI
 
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Analysis of sensor disturbances caused by IEMI

Publication date
2022-08-04
Document type
Conference paper
Author
Pahl, Arne 
Dickmann, Stefan 
Organisational unit
DTEC.bw 
Grundlagen der Elektrotechnik 
DOI
10.15488/12572
URI
https://openhsu.ub.hsu-hh.de/handle/10.24405/14683
Conference
Kongress für Elektromagnetische Verträglichkeit (EMV 2022) ; Köln ; 12.-14.07.2022
Project
Elektromagnetische Störfestigkeit autonomer Systeme 
Book title
Proceedings EMV Kongress 2022 : Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit, Köln, 12.-14.07.2022
First page
159
Last page
165
Peer-reviewed
✅
Part of the university bibliography
✅
  • Additional Information
Keyword
dtec.bw
Version
Published version
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Metadata only access

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